High performance multi-channel MOSFET on InGaAs for RF amplifiers
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science
Reference21 articles.
1. Impact of halo doping on the subthreshold performance of deep-submicrometer CMOS devices and circuits for ultralow power analog/mixed-signal applications;Chakraborty;IEEE Trans. Electron Devices,2007
2. 2-D modeling of potential distribution and threshold voltage of short channel fully depleted dual material gate SOI MESFET;Hashemi;Elsevier Solid-State Electron.,2005
3. A novel digital etch technique for deeply scaled III-V MOSFETs;Lin;IEEE Electron Device Lett.,2014
4. Nonplanar InGaAs gate wrapped around field-effect transistors;Xue;IEEE Trans. Electron Devices,2014
5. A new dual-material double-gate (DMDG) nanoscale SOIMOSFET–Two-dimensional analytical modeling and simulation;Reddy;IEEE Trans. Nanotechnol.,2005
Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Effect of Defects on the Switching Performance of Silicon-Gate All Around Dielectric Window Spaced-Multi-channel MOSFET;Silicon;2024-02-29
2. RTS Noise Characterization of Trap Properties in InGaAs nFinFETs;IEEE Transactions on Electron Devices;2023-07
3. IV Characteristics and Subthreshold Slope Analysis of Si and SiGe-Based Dual-Gate MOSFET;Springer Proceedings in Materials;2023
4. Impact of Composite Trench Stepped Hetero Channel MOSFET on Analog Performance;2022 IEEE VLSI Device Circuit and System (VLSI DCS);2022-02-26
5. Investigation of Electrical Parameters and Low-Frequency Noise Analysis of a Heterojunction TFET;Lecture Notes in Electrical Engineering;2021-09-10
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3