Influence of working pressure on the structural, optical, and electrical properties of RF-sputtered SnS thin films-Reference-Cited by-同舟云学术

Influence of working pressure on the structural, optical, and electrical properties of RF-sputtered SnS thin films

Published:2018-10 Issue: Volume:122 Page:253-261
ISSN:0749-6036
Container-title:Superlattices and Microstructures
language:en
Short-container-title:Superlattices and Microstructures

Author:

Arepalli Vinaya Kumar,Shin Yeonbae,Kim Jeha

Funder

Korea Institute of Energy Technology Evaluation and Planning

Ministry of Science, ICT & Future Planning

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science

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