Test results and prospects for RD53A, a large scale 65 nm CMOS chip for pixel readout at the HL-LHC

Author:

Gaioni Luigi

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference7 articles.

1. RD53 web site, http://rd53web.cern.ch/rd53/.

2. Characterization of radiation effects in 65 nm digital circuits with the DRAD digital radiation test chip;Casas;J. Instrum.,2017

3. CHIPIX65: Developments on a new generation pixel readout ASIC in CMOS 65 nm for HEP experiments;Demaria,2015

4. Results of FE65-P2 pixel readout test chip for high luminosity LHC upgrades;Garcia-Sciveres,2016

5. L. Gaioni, et al. Design of analog front-end for the RD53 demonstrator chip, in: Proceedings of Science, PoS (VERTEX 2016) p. 036.

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