Neutron-induced soft error rate measurements in semiconductor memories-Reference-Cited by-同舟云学术

Neutron-induced soft error rate measurements in semiconductor memories

Published:2007-08 Issue:1 Volume:579 Page:252-255
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Ünlü Kenan,Narayanan Vijaykrishnan,Çetiner Sacit M.,Degalahal Vijay,Irwin Mary J.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference8 articles.

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5. N. Seifert, D. Moyer, N. Leland, R. Hokinson, in: IEEE 39th Annual International Reliability Physics Symposium, 2001, p. 259.

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