Dark-lifetime degradation of GaAs photo-cathode at higher temperature-Reference-Cited by-同舟云学术

Dark-lifetime degradation of GaAs photo-cathode at higher temperature

Published:2011-05 Issue:1 Volume:637 Page:S87-S90
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Kuriki M.,Shonaka C.,Iijima H.,Kubo D.,Okamoto H.,Higaki H.,Ito K.,Yamamoto M.,Konomi T.,Okumi S.,Kuwahara M.,Nakanishi T.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference13 articles.

1. ILC Reference Design Report, ILC-Report-2007-1, 2007.

2. H. Braun et al., CLIC 2008 Parameters, CERN, CLIC-Note-764, 2008.

3. Design Study of Compact ERL, KEK Report 2007-7, 2007.

4. The European X-ray Free Electron Laser Technical Design Report, DESY 2006-97, 2006.

Cited by 24 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

2. HERACLES: A high-voltage DC test beamline for high average current photocathodes;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2023-07