Collection of holes in thick TlBr detectors at low temperature-Reference-Cited by-同舟云学术

Collection of holes in thick TlBr detectors at low temperature

Published:2012-10 Issue: Volume:689 Page:7-11
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Dönmez Burçin,He Zhong,Kim Hadong,Cirignano Leonard J.,Shah Kanai S.

Funder

the U.S. Department of Homeland Security

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference10 articles.

1. Front Matter: Volume 7079

2. Degradation effects in TlBr single crystals under prolonged bias voltage

3. B. Dönmez, S.E. Anderson, Z. He, L.J. Cirignano, H. Kim, K.S. Shah, in: IEEE Nuclear Science Symposium, Medical Imaging Conference Record, 2008, pp. 291–293.

4. The stability of TlBr detectors at low temperature

5. 1-D position sensitive single carrier semiconductor detectors

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