Annealing study of a bistable cluster defect-Reference-Cited by-同舟云学术

Annealing study of a bistable cluster defect

Published:2010-01 Issue:3 Volume:612 Page:525-529
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Junkes Alexandra,Eckstein Doris,Pintilie Ioana,Makarenko Leonid F.,Fretwurst Eckhart

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference17 articles.

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3. I. Pintilie, E. Fretwurst, A. Junkes, G. Lindström, in: IEEE Nuclear Science Symposium, Dresden, Germany, 19–25 October, 2008.

4. Defect-driven gain bistability in neutron damaged, silicon bipolar transistors

5. A bistable divacancylike defect in silicon damage cascades

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