Comment on “Spectral identification of thin film coated and solid form semiconductor neutron detectors” by McGregor and Shultis-Reference-Cited by-同舟云学术

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Comment on “Spectral identification of thin film coated and solid form semiconductor neutron detectors” by McGregor and Shultis

Published:2005-01 Issue:1-2 Volume:536 Page:228-231
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Hallbeck S.,Caruso A.N.,Adenwalla S.,Brand J.,Byun Dongjin,Jiang H.X.,Lin J.Y.,Losovyj Ya.B.,Lundstedt C.,McIlroy D.N.,Pitts W.K.,Robertson B.W.,Dowben P.A.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference31 articles.

1. Spectral identification of thin-film-coated and solid-form semiconductor neutron detectors

2. Ph. Avoiris;Lyo;Phys. Rev. Lett,1989

3. Selective area, synchrotron radiation induced, delta doping of silicon

4. Characterization of boron carbide thin films fabricated by plasma enhanced chemical vapor deposition from boranes

5. Nickel doping of boron carbide grown by plasma enhanced chemical vapor deposition

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The physics of solid-state neutron detector materials and geometries;Journal of Physics: Condensed Matter;2010-10-10

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