Author:
Fuochi P.G.,Corda U.,Gombia E.,Lavalle M.
Subject
Instrumentation,Nuclear and High Energy Physics
Reference12 articles.
1. Irradiation of power semiconductor devices by high energy electrons: The Italian experience
2. P.G. Fuochi, M. Lavalle, E. Gombia, R. Mosca, A. Kovács, A. Vitanza, A. Patti, IAEA-TECDOC-1070, March 1999, p. 95.
3. In-plant calibration and use of power transistors for process control of gamma and electron beam facilities
4. P.G. Fuochi, M. Lavalle, E. Gombia, R. Mosca, A V. Kovács, P. Hargittai, A. Vitanza, A. Patti, IAEA-TECDOC-1201, March 2001, p. 113.
5. Deep‐level transient spectroscopy: A new method to characterize traps in semiconductors
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