Analysis of measurement sensitivity to illuminance and fringe-pattern gray levels for fringe-pattern projection adaptive to ambient lighting

Author:

Waddington Christopher,Kofman Jonathan

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference17 articles.

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4. Kofman J, Wu JT, Borribanbunpotkat K. Multiple-line full-field laser-camera range sensor. In: Kofman J, Lopez de Meneses Y, Kaneko S, Perez CA, Coquin D, editors, Optomechatronic Computer-Vision Systems II, Proceedings of the SPIE, vol. 6718, 2007, p. 67180A-1-9.

5. Phase-measurement interferometry techniques;Creath,1988

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