Simultaneous spatial and angular positioning of plane specular samples by a novel double beam triangulation probe with full auto-compensation-Reference-Cited by-同舟云学术

Simultaneous spatial and angular positioning of plane specular samples by a novel double beam triangulation probe with full auto-compensation

Published:2016-02 Issue: Volume:77 Page:137-142
ISSN:0143-8166
Container-title:Optics and Lasers in Engineering
language:en
Short-container-title:Optics and Lasers in Engineering

Author:

Makai Janos P.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference9 articles.

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4. Optical triangulation-based microtopographic inspection of surfaces;Costa;Sensors,2012

5. M.C. Jurca, Method and apparatus for determining the distance between a base and a specular surface by means of radiation reflected at the surface. U.S. patent no. 5933240; 1999

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