Instantaneous imaging technology for phase-stepping photoelasticity using pixelated microretarder array camera-Reference-Cited by-同舟云学术

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Instantaneous imaging technology for phase-stepping photoelasticity using pixelated microretarder array camera

Published:2024-09 Issue: Volume:180 Page:108331
ISSN:0143-8166
Container-title:Optics and Lasers in Engineering
language:en
Short-container-title:Optics and Lasers in Engineering

Author:

Yoneyama S.^ORCID,Sakaue K.

Publisher

Elsevier BV

Reference57 articles.

1. Experimental techniques in fracture;Epstein,1993

2. Thermal stresses in microelectronics subassemblies: quantitative characterization using photomechanics methods;Han;J Therm Stresses,2003

3. Applied stress analysis;Durelli,1967

4. Photoelastic tomography for residual stress measurement in glass;Aben;Opt Eng,2005

5. Fourier-transform method of fringe-pattern analysis for computer based topography and interferometry;Takeda;J Opt Soc Am,1982

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