Velocity saturation in short channel field effect transistors
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Condensed Matter Physics,General Chemistry
Reference8 articles.
1. Review of experimental aspects of hot electron transport in MOS structures
2. Hot Electron Effects and Saturation Velocities in Silicon Inversion Layers
3. Hot electrons in Si inversion layer
4. Transport of hot carriers in semiconductor quantized inversion layers
5. Monte Carlo calculation of hot electron drift velocity in silicon (100)-inversion layer by including three subbands
Cited by 22 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Monte Carlo study of electron transport in silicon inversion layers;Physical Review B;1993-07-15
2. Performance limits of deep submicron N- and P-channel MOS transistors;Microelectronics Journal;1991-02
3. Analytical device model for submicrometer MOSFET's;IEEE Transactions on Electron Devices;1991
4. Carrier Transport in Bulk Silicon and in Weak Silicon Inversion Layers;Advances in Electronics and Electron Physics;1990
5. High-field drift velocity of electrons in silicon inversion layers;Solid-State Electronics;1988-01
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