Unification of contemporary negative bias temperature instability models for p-MOSFET energy degradation-Reference-Cited by-同舟云学术

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Unification of contemporary negative bias temperature instability models for p-MOSFET energy degradation

Published:2013-10 Issue: Volume:26 Page:776-780
ISSN:1364-0321
Container-title:Renewable and Sustainable Energy Reviews
language:en
Short-container-title:Renewable and Sustainable Energy Reviews

Author:

Karim Nissar Mohammad,Manzoor Sadia,Soin Norhayati

Funder

Bright Sparks Unit (BSU)

University of Malaya (UM)

UM/MOHE HIRGA

Publisher

Elsevier BV

Subject

Renewable Energy, Sustainability and the Environment

Reference29 articles.

1. Reliability and economic evaluation of small autonomous power systems containing only renewable energy sources;Georgilakis;Renewable Energy,2009

2. Sizing of integrated renewable energy system based on load profiles and reliability index for the state of Uttarakhand in India;Kanase-Patil;Renewable Energy,2011

3. Reliability based socio economic optimal renewable energy model for India;Iniyan;Renewable Energy,2000

4. Exergy and reliability analysis of wind turbine systems: a case study;Ozgener;Renewable and Sustainable Energy Reviews,2007

5. Reliability and cost analyses of electricity collection systems of a marine current farm—a Taiwanese case study;Lee;Renewable and Sustainable Energy Reviews,2009

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A modelling method of the on-state resistance of p-channel power MOSFETs under NBTI stress;Microelectronics Reliability;2023-11

2. Exploration of Physicochemical Mechanism for Negative Bias Temperature Instability in GaN‐HEMTs by Extracting Activation Energy of Dislocations;Advanced Materials Interfaces;2022-07-28

3. A 2D compact model for lightly doped DG MOSFETs (P-DGFETs) including negative bias temperature instability (NBTI) and short channel effects (SCEs);Microelectronics Reliability;2016-12

4. Analysis of recoverable and permanent components of threshold voltage shift in NBT stressed p-channel power VDMOSFET;Chinese Physics B;2015-09-29

5. Nickel content effect on the microstructural, optical and electrical properties of p-type Mn3O4 sprayed thin films;Journal of Alloys and Compounds;2015-03

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