Correlating Failure Mode Effect Analysis (FMEA) & Overall Equipment Effectiveness (OEE)

Author:

Ahire Chandrajit P.,Relkar Anand S.

Publisher

Elsevier BV

Subject

Applied Mathematics

Reference3 articles.

1. Pomorski Tom, Semiconductor Fairchild,, “Managing Overall Equipment Effectiveness to Optimize Factory Performance”, IEEE, page 33-36,1997.

2. Besterfield Dale “Total Quality Management” Pearson Education, page 449-453, 2003.

3. Esmaeilian G R, MegatAhmad M M H, Ismail N, Sulaiman S “Particular Model for Improving FMEA by using OEE”, IEEE, 978-1-4244-2328-6, 2008.

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