Reliability of Laser Diodes for High-rate Optical Communications – A Monte Carlo-based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions-Reference-Cited by-同舟云学术

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Reliability of Laser Diodes for High-rate Optical Communications – A Monte Carlo-based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions

Published:2021 Issue: Volume: Page:79-137
ISSN:
Container-title:Advanced Laser Diode Reliability
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Author:

Mendizabal Laurent,Verdier Frédéric,Deshayes Yannick,Ousten Yves,Danto Yves,Béchou Laurent

Publisher

Elsevier

Reference41 articles.

1. High reliability and high performance of 9xx-nm single emitter laser diodes;Bao,2011

2. Performances and reliability predictions of optical data transmission links using a system simulator for aerospace applications;Béchou,2013

3. Monte-Carlo computations for predicted degradation of photonic devices in space environment;Béchou,2015

4. Reliability Prediction from Burn-In Data Fit to Reliability Models;Bernstein,2014

5. Electrical characteristics and reliability of UV transparent Si3N4 metal-insulator-metal (MIM);Bolam;capacitors. IEEE Transactions on Electron Devices,2002

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