Metrological Limitations of Optical Probing Techniques for Dimensional Measurements-Reference-Cited by-同舟云学术

Metrological Limitations of Optical Probing Techniques for Dimensional Measurements

Published:1995 Issue:1 Volume:44 Page:501-504
ISSN:0007-8506
Container-title:CIRP Annals
language:en
Short-container-title:CIRP Annals

Author:

De Chiffre L.,Hansen H.N.

Publisher

Elsevier BV

Subject

Industrial and Manufacturing Engineering,Mechanical Engineering

Reference10 articles.

1. Measurement of Diameter Using Charge Coupled Device (CCD);Takesa;Annals of the CIRP,1984

2. Vision Systems for Dimensional Metrology;Poulter;Annals of the CIRP,1985

3. Automated Visual Inspection.;Batchelor,1985

4. Image Processing in a Production Environment;Tönshoff;Annals of the CIRP,1988

5. Hüser-Teuchert, D., Trapet, E., Garces, A., Torres-Leza, F., Pfeifer, T., Schrarsich, P. 1994, Performance test procedures for optical coordinate mesuring probes. BCR report EUR 15314 EN.

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