1. ASME/ANSI B46.1-1985. Surface Texture,1985
2. Standardized Total Integrated Scatter Measurements of Optical Surfaces;Detrio;Opt. Eng,1985
3. Specifying Surface Quality;Abbott;J. Mech. Eng,1933
4. Bennett, J.M., Bristow, T.C., Arackellian, K., and Wyant, J.C., October 1986, Surface Profiling with Optical and Mechanical Instruments, presented at the Optical Fabrication and Testing Workshop, Seattle, USA.
5. Lindsey, K., Smith, S.T., and Robbie, C.J., May 1987, “NPL Nansurf 2”: A Sub-Nanometre Accuracy Stylus-Based Surface Texture and Profile Measuring System with a Wide Range and Low Environmental Susceptibility, presented at the 4th International Precision Engineering Seminar, Cranfield, UK.