Analysis of matrix characterization by X-ray diffraction and synchrotron radiation-Reference-Cited by-同舟云学术

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Analysis of matrix characterization by X-ray diffraction and synchrotron radiation

Published:2002-11 Issue:4-5 Volume:65 Page:501-505
ISSN:0969-806X
Container-title:Radiation Physics and Chemistry
language:en
Short-container-title:Radiation Physics and Chemistry

Author:

Barroso R.C,Anjos M.J,Lopes R.T,de Jesus E.F.O,Braz D,Castro C.R.F,Uhl A

Publisher

Elsevier BV

Subject

Radiation

Reference7 articles.

1. Quantitative analysis of metals in soil using X-ray fluorescence;Anjos;Spectrochim. Acta B,2000

2. X-ray diffraction tomography using interference effects;Barroso;Nucl Instrum. Methods Phys. Res. A,1998

3. Image reconstruction algorithm to X-ray diffraction tomography;Barroso;Nucl. Instrum. Methods Phys. Res. A,1999

4. A versatile X-ray diffraction station at LNLS (Brazil);Cusatis;J. Synchrotron Radiat.,1998

5. Synchrotron radiation fluorescence analysis of trace elements in Nerium Oleander for pollution monitoring;De Jesus;Spectrochim. Acta B,2000

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Varying constants;Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences;2005-07-28

2. Atomic spectrometry update. X-ray fluorescence spectrometry;Journal of Analytical Atomic Spectrometry;2003

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