Hot probe technique for thin films Seebeck coefficient measurement
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Published:2024-09
Issue:
Volume:23
Page:102789
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ISSN:2590-1230
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Container-title:Results in Engineering
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language:en
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Short-container-title:Results in Engineering
Author:
Hapenciuc C.L.ORCID,
Oane M.,
Visan A.ORCID,
Ristoscu C.ORCID,
Stochioiu A.,
Urzica I.,
Dumitru M.ORCID,
Anghel S.,
Borca-Tasciuc T.,
Mihailescu I.N.ORCID