Finite element periodic catenary model to perform HIL pantograph tests considering non-linear dropper behaviour-Reference-Cited by-同舟云学术

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Finite element periodic catenary model to perform HIL pantograph tests considering non-linear dropper behaviour

Published:2022-11 Issue: Volume:210 Page:103816
ISSN:0168-874X
Container-title:Finite Elements in Analysis and Design
language:en
Short-container-title:Finite Elements in Analysis and Design

Author:

Gil J.,Tur M.,Gregori S.,Correcher A.^ORCID,Fuenmayor F.J.

Funder

Generalitat Valenciana

Ministerio de Ciencia e Innovación

Gobierno de España Ministerio de Ciencia e Innovación

Publisher

Elsevier BV

Subject

Applied Mathematics,Computer Graphics and Computer-Aided Design,General Engineering,Analysis

Reference27 articles.

1. Pantograph–catenary interaction: recent achievements and future research challenges;Bruni;Int. J. Rail Transp.,2018

2. The results of the pantograph-catenary interaction benchmark;Bruni;Veh. Syst. Dyn.,2015

3. Editorial: Recent advances and applications of hybrid simulation;Song;Front. Built Environ.,2020

4. Hardware-in-the-loop hybrid simulation of pantograph–catenary interaction;Facchinetti;J. Sound Vib.,2012

5. Contact wire irregularity stochastics and effect on high-speed railway pantograph–catenary interactions;Song;IEEE Trans. Instrum. Meas.,2020

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1. A fast solution method for the interaction between the rigid overhead contact system and pantograph on long railway lines;Vehicle System Dynamics;2024-05-07

2. Effect of spatial moving structure and topology optimization of the CNC turning machine tools;The International Journal of Advanced Manufacturing Technology;2023-10-20

3. Effect of spatial moving structure and topology optimization of the CNC turning machine Tools;2023-08-03

4. Hardware-in-the-loop simulations of a railway pantograph with a finite element periodic catenary model;Vehicle System Dynamics;2023-03-13

5. Hardware-in-the-Loop Test Bench for Simulation of Catenary–Pantograph Interaction (CPI) with Linear Camera Measurement;Sensors;2023-02-04

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