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Effects of ridge cracking and interface sliding on morphological symmetry breaking in straight-sided blisters

  • Published:2018-03 Issue: Volume:112 Page:637-649
  • ISSN:0022-5096
  • Container-title:Journal of the Mechanics and Physics of Solids
  • language:en
  • Short-container-title:Journal of the Mechanics and Physics of Solids

Author:

Li Shi-Chen,Yu Sen-Jiang,He Linghui,Ni Yong

Funder

Strategic Priority Research Program of the Chinese Academy of Sciences

National Natural Science Foundation of China

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics

Reference60 articles.

1. Buckle morphology of compressed inorganic thin layers on a polymer substrate;Abdallah;Thin Solid Films,2006

2. Stability of straight delamination blisters;Audoly;Phys. Rev. Lett.,1999

3. Mode-dependent toughness and the delamination of compressed thin films;Audoly;J. Mech. Phys. Solids,2000

4. Buckling of a stiff film bound to a compliant substrate—Part I: formulation, linear stability of cylindrical patterns, secondary bifurcations;Audoly;J. Mech. Phys. Solids,2008

5. Elasticity and Geometry: from Hair Curls to the Non-Linear Response of Shells;Audoly,2010

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