Measurements of charge collection profiles in virgin and strongly irradiated silicon diodes by means of the micro-IBICC technique-Reference-Cited by-同舟云学术

Measurements of charge collection profiles in virgin and strongly irradiated silicon diodes by means of the micro-IBICC technique

Published:2002-01 Issue:3 Volume:476 Page:607-613
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Vittone E,Manfredotti C,Fizzotti F,Lo Giudice A,Lorenzi A,Galassini S,Jaksic M

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference11 articles.

1. M.B.H. Breese, D.N. Jamieson, P.J.C. King, Material analysis using a nuclear microprobe, Wiley, New York, 1996, ISBN 0-471-10608-9.

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