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Electronic properties of traps induced by γ-irradiation in CdTe and CdZnTe detectors

  • Published:2000-07 Issue:3 Volume:448 Page:558-566
  • ISSN:0168-9002
  • Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
  • language:en
  • Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Cavallini A,Fraboni B,Chirco P,Morigi M.P,Zanarini M,Auricchio N,Caroli E,Dusi W,Fougeres P,Hage-Ali M,Siffert P

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference10 articles.

1. Study of the Radiation Damage Induced by High Energy Gamma-Ray in CdTe Detectors

2. P. Chirco, E. Caroli, A. Cavallini, W. Dusi, B. Fraboni, M. Hage Alì, M.P. Morigi, P. Siffert, M. Zanarini, IEEE Trans. Nucl. Sci., in press.

3. Comparative evaluation of the temperature dependence of different noise sources in CdTe detectors

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