Test methods for single event upset/latch-up-Reference-Cited by-同舟云学术

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Test methods for single event upset/latch-up

Published:1994-01 Issue:1-2 Volume:43 Page:165-174
ISSN:0969-806X
Container-title:Radiation Physics and Chemistry
language:en
Short-container-title:Radiation Physics and Chemistry

Author:

Harboe-Sorensen R.

Publisher

Elsevier BV

Subject

Radiation

Reference22 articles.

1. Cosmic ray effects on microelectronics;Adam;Part IV. NRL Memorandum Report 5901,1986

2. Cosmic ray effects in microelectronics Part I. The near earth particle environment;Adams;NRL Memo Report 4506,1981

3. Measurements of SEU and total dose in geostationary orbit under normal and solar flare conditions;Adams;IEEE Trans. Nucl. Sci.,1991

4. A verfied proton induced latch-up in space;Adams,1992

5. Proton upsets in orbit;Bendel;IEEE Trans. Nucl. Sci.,1983

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. An overview of radiation effects on electronics in the space telecommunications environment;Microelectronics Reliability;2000-01

2. Heavy ion and proton test site at JYFL-accelerator laboratory;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1999-04

3. Temporal analysis of SEU in SOI/GAA SRAMs;IEEE Transactions on Nuclear Science;1995-12

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