Silicon-on-insulator technology for high temperature metal oxide semiconductor devices and circuits-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Silicon-on-insulator technology for high temperature metal oxide semiconductor devices and circuits

Published:1995-01 Issue:1-3 Volume:29 Page:7-12
ISSN:0921-5107
Container-title:Materials Science and Engineering: B
language:en
Short-container-title:Materials Science and Engineering: B

Author:

Flandre Denis

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference26 articles.

1. Proc. 1st Euro. Conf. on High Temperature Electronics;Buckley-Golder,1993

2. Electrical Characteristics of Large-Scale Integration Silicon MOSFET's at Very High Temperatures,Part III: Modeling and Circuit Behavior

3. Silicon-on-Insulator Technology: Materials to VLSI;Colinge,1991

4. Modeling of ultrathin double-gate nMOS/SOI transistors

Cited by 28 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. CMOS Compatible Hydrogen Sensor Using Platinum Gate and ALD–Aluminum Oxide;Sensors;2024-05-10

2. Novel Ag-Cu foam sheet with multi-layer composite structure for high performance joining of SiC power chips;Materials Characterization;2024-03

3. FD-SOI and RF-SOI technologies for 5G;New Materials and Devices Enabling 5G Applications and Beyond;2024

4. Physics and Electrical Diagnostics of Nanoelectronic Silicon-On-Insulator Structures and Devices;2023

5. Investigation of p-type High Temperature Field Effect Transistor for CMOS Logic Application;JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE;2022-10-31

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP