Cross-sectional atomic force imaging of semiconductor heterostructures
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference8 articles.
1. Atomic‐scale view of AlGaAs/GaAs heterostructures with cross‐sectional scanning tunneling microscopy
2. Quantum wire heterostructure for optoelectronic applications
3. Interface stress of AlxGa1−xAs–GaAs layer structures
4. An improved technique for selective etching of GaAs and Ga1−xAlxAs
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1. Aspects of scanning force microscope probes and their effects on dimensional measurement;Journal of Physics D: Applied Physics;2008-04-08
2. Site controlling of InAs quantum wires on cleaved edges of AlGaAs/GaAs superlattices;Nanotechnology;2005-06-17
3. Growth and optical characterization of dense arrays of site-controlled quantum dots grown in inverted pyramids;Physica E: Low-dimensional Systems and Nanostructures;2004-03
4. Metrology of semiconductor device structures by cross-sectional AFM;Materials Science and Engineering: B;2001-03
5. Cross-sectional atomic force microscopy imaging of polycrystalline thin films;Ultramicroscopy;2000-10
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