Thickness-dependent optoelectronic properties of CuCr 0.93 Mg 0.07 O 2 thin films deposited by reactive magnetron sputtering-Reference-Cited by-同舟云学术

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Thickness-dependent optoelectronic properties of CuCr 0.93 Mg 0.07 O 2 thin films deposited by reactive magnetron sputtering

Published:2017-06 Issue: Volume:63 Page:295-302
ISSN:1369-8001
Container-title:Materials Science in Semiconductor Processing
language:en
Short-container-title:Materials Science in Semiconductor Processing

Author:

Sun Hui,Arab Pour Yazdi Mohammad,Ducros Cedric,Chen Sheng-Chi,Aubry Eric,Wen Chao-Kuang,Hsieh Jang-Hsing,Sanchette Frederic,Billard Alain

Funder

China Scholarship Council

Pays de Montbéliard-Agglomération

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference61 articles.

1. Structural, optical and electrical properties of Nd-doped SnO2 thin films fabricated by reactive magnetron sputtering for solar cell devices;Bouras;Sol. Energy Mater. Sol. Cells,2016

2. Crystallization and electrical properties of ITO:Ce thin films for flat panel display applications;Kim;Thin Solid Films,2009

3. Growth and characterization of nonpolar (10-10) ZnO transparent conductive oxide on semipolar (11-22) GaN-based light-emitting diodes;Kim;J. Alloy. Compd.,2016

4. InGaN/GaN blue light emitting diodes using Al-doped ZnO grown by atomic layer deposition as a current spreading layer;Kong;J. Cryst. Growth,2011

5. Fabrication of highly transparent and conductive indium-tin oxide thin films with a high figure of merit via solution processing;Chen;Langmuir,2013

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