Electrical, morphological and structural properties of Ti ohmic contacts formed on n-type 4H–SiC by laser thermal annealing
Author:
Funder
Electronic Components and Systems for European Leadership
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
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2. Nickel Ohmic Contacts Formed on 4H-SiC by UV Laser Annealing;Solid State Phenomena;2024-08-22
3. Electrical and Structural Properties of Ohmic Contacts of SiC Diodes Fabricated on Thin Wafers;Solid State Phenomena;2024-08-22
4. How to Accurately Determine the Ohmic Contact Properties on n-Type 4H-SiC;Electronics;2024-01-03
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