Confirmation of the presence of edge dislocations in the prepared FCC ZnTe nanocrystals from the study of structural analysis through the MWH method with added Fourier analysis (W-A method) of diffraction peaks
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Published:2024-08
Issue:
Volume:179
Page:108477
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ISSN:1369-8001
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Container-title:Materials Science in Semiconductor Processing
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language:en
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Short-container-title:Materials Science in Semiconductor Processing
Author:
Basak Sanghita,Das Ratan