3-D surface profilometry using simultaneous phase-shifting interferometry-Reference-Cited by-同舟云学术

3-D surface profilometry using simultaneous phase-shifting interferometry

Published:2010-09 Issue:18 Volume:283 Page:3376-3382
ISSN:0030-4018
Container-title:Optics Communications
language:en
Short-container-title:Optics Communications

Author:

Chen Liang-Chia,Yeh Sheng-Lih,Tapilouw Abraham Mario,Chang Jui-Chin

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference26 articles.

1. Surface profile measurement using color fringe projection

2. One-step phase shift 3-D surface profilometry with grating projection

3. Composite structured light pattern for three-dimensional video

4. 3-D shape measurement by composite pattern projection and hybrid processing

5. 3-D shape measurement by composite pattern projection and hybrid processing

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