Large depth-of-field 3D measurement with a microscopic structured-light system-Reference-Cited by-同舟云学术

Large depth-of-field 3D measurement with a microscopic structured-light system

Published:2021-02 Issue: Volume:481 Page:126540
ISSN:0030-4018
Container-title:Optics Communications
language:en
Short-container-title:Optics Communications

Author:

Liu Yanzhao,Fu Yanjun,Zhuan Yuhao,Zhou Pengxu,Zhong Kejun,Guan Bingliang

Funder

National Natural Science Foundation of China

Jiangxi Provincial Department of Education Science and Technology

Foundation of Key Laboratory of Nondestructive Testing (Nanchang Hangkong University), Ministry of Education

Foundation of Key Laboratory of Jiangxi Province for image processing and pattern recognition, Nanchang Hangkong university

Nanchang Hangkong University

Natural Science Foundation of Jiangxi Province

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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2. Strategy for automatic and complete three-dimensional optical digitization;Liu;Opt. Lett.,2012

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4. Three-dimensional shape measurement with binary dithered patterns;Wang;Appl. Opt.,2012

5. Improved intensity-optimized dithering technique for 3D shape measurement;Sun;Opt. Lasers Eng.,2015

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2. Adaptive focus stacking for large depth-of-field microscopic structured-light 3D imaging;Applied Optics;2024-04-16

3. Electrically tunable lens assisted absolute phase unwrapping for large depth-of-field 3D microscopic structured-light imaging;Optics and Lasers in Engineering;2024-03

4. Defocus-Driven Variable-Shape Fringe for Accuracy Improvement in Fringe Projection Profilometry;IEEE Transactions on Instrumentation and Measurement;2024

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