Modeling of glancing incidence X-ray for depth profiling of thin layers
Author:
Publisher
Elsevier BV
Subject
Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry
Reference10 articles.
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3. In situ grazing incidence X-ray diffraction study of strain evolution during growth and postgrowth annealing of MnAs on GaAs (113)A;Satapathy;J. Phys., D. Appl. Phys.,2005
4. Surface-sensitive X-ray fluorescence and diffraction analysis with grazing—exit geometry;Noma;X-ray Spectrom.,1999
5. Soft X-rays and Extreme Ultraviolet Radiation: Principles and Applications;Attwood,1999
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