Calculation of the contribution of scattering effects to X-ray fluorescence intensity for coating samples
Author:
Publisher
Elsevier BV
Subject
Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry
Reference17 articles.
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3. Lama III — A computer program for quantitative XRFA of bulk specimens and thin film layers;Mantler;Adv. X-Ray Anal.,1984
4. New developments in FP-based software for both bulk and thin-film XRF analysis;Feng;Adv. X-Ray Anal.,1992
5. Multilayer and thin-film analysis using FPMulti software;Bekkers;X-Ray Spectrom.,1997
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