Experiments and failure analysis of a charged board event on a hard disk drive printed circuit board assembly-Reference-Cited by-同舟云学术

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Experiments and failure analysis of a charged board event on a hard disk drive printed circuit board assembly

Published:2022-01 Issue: Volume:115 Page:103657
ISSN:0304-3886
Container-title:Journal of Electrostatics
language:en
Short-container-title:Journal of Electrostatics

Author:

Chumpen S.,Pimpakun S.,Charoen B.,Pornnimitra S.,Plong-ngooluam S.,Voldman S.H.,Sa-ngiamsak C.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Biotechnology,Electronic, Optical and Magnetic Materials

Reference20 articles.

1. October). ESD and disturbance cases in electrostatic protected areas;Tamminen,2015

2. Charged board event simulation for validating ESD control program of hard disk drive assembly processes;Pimpakun;IEEE 3rd Int. Conf. Circ., Syst. Dev. (ICCSD),2019

3. Real-world charged board model (CBM) failures;Olney;IEEE Electr. Overstress/Electrostat. Discharg. Sympos.,2003

4. Charged board model ESD simulation for PCB mounted MOS transistors;Kuznetsov;IEEE Trans. Electromagn C.,2015

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. ESD Induced Irreversible Degradation Processes in the Semiconductor Devices;2024 6th International Youth Conference on Radio Electronics, Electrical and Power Engineering (REEPE);2024-02-29

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