Beam analysis of scanning electron microscope according to the mirror effect phenomenon

Author:

Al-Obaidi Hassan N.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Biotechnology,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. Formal investigation of the mirror effect in SEM;Abbood,2011

2. Characterizations of the mirror effects induced from a PET sample in SEM and FIB;Abdulwahab,2008

3. Computational investigation of electron path inside SEM chamber in mirror effect phenomenon;Al-Obaidi;Micron,2013

4. Failure limit investigation for the spline aided solution technique;Al-Obaidi;Mod. Phys. Lett. B,2009

5. An anomalous contrast in scanning electron microscopy of insulators: the pseudo-mirror effect;Belhaj;Scanning,2000

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