Methods Based on Multiple-Slit Fourier Transform Interferometry for Determining Thin-Film Optical Constants in the VUV/Soft X-Ray Range

Author:

Tatchyn Roman

Publisher

Elsevier

Reference66 articles.

1. Analysis of a new method for determining optical constants in the soft x-ray region;Tatchyn;Optica Acta,1980

2. The Introduction and Development of a New Method for Measuring the Optical Constants of Metals in the Soft X-Ray Range;Tatchyn,1982

3. Derivation of the Optical Constants of Gold from Transmission Diffraction Measurements in the 280-640 eV Range;Tatchyn;Phys. Rev. Lett.,1984

4. X-Ray and Neutron Interferometry;Bonse,1977

5. The Application of Synchrotron Radiation to X-Ray Interferometry;Hart;Nucl. Instr. Meth.,1980

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