Effect of LaNiO3 sol concentration on the structure and dielectric properties of Pb(Zr0.53Ti0.47)O3 thin films grown on LaNiO3-coated Si substrates
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference17 articles.
1. Pyroelectric thin film sensor arrays integrated on silicon
2. Ferroelectric fatigue of Pb(Zr,Ti)O3 thin films measured in atmospheres of varying oxygen concentration
3. Effect of oxygen content and thickness of sputtered RuOx electrodes on the ferroelectric and fatigue properties of sol–gel PZT thin films
4. The effect of LaNiO3 buffer layer thickness on the electric properties of Pb(Zr0.53Ti0.47)O3 thin films deposited on titanium foils
5. Effect of heat-treatment on LaNiO3film electrode of PZT thin films derived by a sol–gel method
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1. A two-step wet etching process of PZT thin film with ultra-low undercut for MEMS applications;Sensors and Actuators A: Physical;2023-01
2. Bipolar resistive switching characteristics of PbZrO3/LaNiO3 heterostructure thin films prepared by a sol–gel process;Ceramics International;2021-02
3. Multifunctional Complex Oxide Processing;Recent Advances in Complex Functional Materials;2017
4. Role of morphological characteristics on the conductive behavior of LaNiO3 thin films;Ceramics International;2016-11
5. Structural, dielectric, ferroelectric and optical properties of PBCT, PBST and PCST complex thin films on LaNiO3 metallic conductive oxide layer coated Si substrates by the CSD technique;Journal of Alloys and Compounds;2014-10
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