Analytical and finite element method design of quartz tuning fork resonators and experimental test of samples manufactured using photolithography 2: comprehensive analysis of resonance frequencies using Sezawa's approximations

Author:

Lee Sungkyu,Moon Yangho,Lee Jaekyu,Yoon Jeongho,Moon Ji-Hoon,Kim Jong-hee,Yoo Seung-Hyun,Chung Hyungsik

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

Reference27 articles.

1. Analytical and finite element method design of quartz tuning fork resonators and experimental test of samples manufactured using photolithography 1—significant design parameters affecting static capacitance C0

2. Design optimization of surface mount device 32.768kHz quartz tuning fork-type crystals using finite element method and statistical analysis of test samples manufactured using photolithography

3. Itoh H, Matsumoto T. In: Proceedings of 1999 joint meeting of the European frequency and time forum and the IEEE international frequency control symposium, Besançon, France: 13–16 April 1999. p. 494.

4. Kanbayashi S, Okano S, Hirama K, Kudama T, Konno M, Tomikawa Y. In: Proceedings of the 30th annual symposium on frequency control, US Army Electronics Command, Fort Monmouth, NJ: 2–4 June 1976. p. 167.

5. Fabrication of an array of surface mount device 32.768kHz quartz tuning fork-type crystals: photolithography and selective etching of an array of quartz tuning fork resonators with subsequent photoresist spray coating

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