Coaxial impact-collision ion scattering spectroscopy analysis of ZnO thin films and single crystals-Reference-Cited by-同舟云学术

Coaxial impact-collision ion scattering spectroscopy analysis of ZnO thin films and single crystals

Published:1998-11 Issue:2-3 Volume:56 Page:256-262
ISSN:0921-5107
Container-title:Materials Science and Engineering: B
language:en
Short-container-title:Materials Science and Engineering: B

Author:

Ohnishi T.,Ohtomo A.,Ohkuboa I.,Kawasaki M.,Yoshimoto M.,Koinuma H.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference12 articles.

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2. Determination of surface polarity of c-axis oriented ZnO films by coaxial impact-collision ion scattering spectroscopy

3. Inversion domains in GaN grown on sapphire

4. Methods of Surface Analysis;Buck,1975

5. A surface composition study of sulfided cobalt-molybdenum catalysts by low energy Ion Scattering Spectrometry (ISS)

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