Inductively coupled plasma optical emission spectrometry as a reference method for silicon estimation by near infrared spectroscopy and potential application to global-scale studies of plant chemistry-Reference-Cited by-同舟云学术

Inductively coupled plasma optical emission spectrometry as a reference method for silicon estimation by near infrared spectroscopy and potential application to global-scale studies of plant chemistry

Published:2016-11 Issue: Volume:129 Page:231-235
ISSN:0026-265X
Container-title:Microchemical Journal
language:en
Short-container-title:Microchemical Journal

Author:

Quigley Kathleen M.,Althoff Amanda G.,Donati George L.

Publisher

Elsevier BV

Subject

Spectroscopy,Analytical Chemistry

Reference35 articles.

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5. Silicon-augmented resistance of plants to herbivorous insects: a review;Reynolds;Ann. Appl. Biol.,2009

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