Assessing the dislocation density in CdSe nanocrystals from XRD peak profile analysis (XDPPA) assisted by first principles method-Reference-Cited by-同舟云学术

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Assessing the dislocation density in CdSe nanocrystals from XRD peak profile analysis (XDPPA) assisted by first principles method

Published:2022-10 Issue: Volume:144 Page:115376
ISSN:1386-9477
Container-title:Physica E: Low-dimensional Systems and Nanostructures
language:en
Short-container-title:Physica E: Low-dimensional Systems and Nanostructures

Author:

Nath Debojyoti,Das Ratan

Publisher

Elsevier BV

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference42 articles.

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3. Size dependence of exciton fine structure in CdSe quantum dots;Norris;Phys. Rev. B,1996

4. Ezema, the structural and optical properties of metallic doped copper (I) iodide thin films synthesized by SILAR method;Ighodalo;Mater. Res. Bull.,2017

5. Emergence of colloidal quantum-dot light emitting technologies;Shirasaki;Nat. Photonics,2013

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