Study of growth of dot and column in porous silicon samples of various thicknesses prepared at a constant current density-Reference-Cited by-同舟云学术

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Study of growth of dot and column in porous silicon samples of various thicknesses prepared at a constant current density

Published:2015-09 Issue: Volume:73 Page:110-115
ISSN:1386-9477
Container-title:Physica E: Low-dimensional Systems and Nanostructures
language:en
Short-container-title:Physica E: Low-dimensional Systems and Nanostructures

Author:

Gill Fateh Singh,Panwar Varij,Gupta Himanshu,Kalra G.S.,Chawla Shanta,Kumar R.,Mehra R.M.

Publisher

Elsevier BV

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference29 articles.

1. Silicon quantum wire array fabrication by electrochemical and chemical dissolution of wafers

2. Birefringent porous silicon membranes for optical sensing

3. Synthesis and Characterization of a Porous Silicon Filter with Si₃N₄ Whiskers

4. A novel porous silicon sensor for detection of sub-ppm NO2 concentrations

5. E-Selectin-Targeted Porous Silicon Particle for Nanoparticle Delivery to the Bone Marrow

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Trace of increasing dot size in porous silicon systems of same thicknesses;Journal of Crystal Growth;2018-11

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