Surface and depth distribution of components in high alloy stainless steel using secondary ion mass spectrometry
Author:
Publisher
Elsevier BV
Subject
Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Instrumentation
Reference17 articles.
1. Secondary ion mass spectrometry;Zalm;Vacuum,1994
2. Quantitative imaging of trace B in Si and SiO2 using ToF-SIMS;Smentkowski;J. Vac. Sci. Technol. A,2015
3. Applications of secondary ion mass spectrometry (SIMS) in materials science;Mcphail;J. Mater. Sci.,2006
4. Advances in imaging secondary ion mass spectrometry for biological samples;Boxer;Annu. Rev. Biophys.,2009
5. MCsn+-SIMS: an innovative approach for direct compositional analysis of materials without standards;Saha;Energy Procedia,2013
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