1. Paradigm shifts in surface metrology. Part II: The current shift;Jiang;Proc. Royal Soc.,2007
2. D.J. Whitehouse, Handbook of Surface and Nanometrology. Institute of Physics, Bristol, 2003, ISBN 0-7503-05835, pp. 1150 (published in 1994).
3. T. Pfeifer, Production Metrology. München, Wien: Oldenbourg Wissenschaftsverlag, August 2002, pp. 421, ISBN 3-486-25885-0.
4. D.J. Whitehouse, Dual function – surface metrology, in: M.N. Durakbasa, P.H. Osanna, A. Afjehi-Sadat (Eds.), IMEKO 2000 Proceedings, vol. VIII, Wien: Abteilung Austauschbau und Messtechnik, 2000, pp. 321-334, ISBN 3-901888-10-1.
5. Industrial metrology and interchangeable manufacturing under the viewpoint of nanotechnology and nanometrology;Osanna;Bulgarian Academy of Sciences, Problems of Engineering Cybernetics and Robotics,2008