Flaw detection and measurement for 4K Ultra HD thin-film-transistor array panel-Reference-Cited by-同舟云学术

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Flaw detection and measurement for 4K Ultra HD thin-film-transistor array panel

Published:2014-05 Issue: Volume:51 Page:236-240
ISSN:0263-2241
Container-title:Measurement
language:en
Short-container-title:Measurement

Author:

Wang Yao-Chin,Lin Bor-Shyh,Yang Kei-Hsiung

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference12 articles.

1. Expectations for UHDTV displays;Sugawara;SID Symp. Dig. Technol. Pap.,2013

2. Plate design and cost of ownership for in-process FPD test systems;Liu;Solid State Technol.,1997

3. Optical charge-sensing method for testing and characterizing thin-film transistor arrays;Kido;IEEE J. Sel. Top. Quantum Electron.,1995

4. Active Array Testing in Mass Production Using Voltage Imaging;Liu,1995

5. In-process flat-paneldisplay testing with electron beams;Brunner;Proc. SID,1994

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Test System for Thin Film Transistor Parameter Extraction in Active Matrix Backplanes;IEEE Journal of the Electron Devices Society;2019

2. Electro-optical measurement and process inspection for integrated gate driver circuit on thin-film-transistor array panels;Measurement;2015-06

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