Digitisation of surface topography measurement results

Author:

Pawlus Pawel

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference22 articles.

1. The properties of random surface of significance in their contact;Whitehouse;Proc. R. Soc. A,1970

2. Comparison of surface measurement by stylus profiler, AFM and non-contact optical profiler;Poon;Wear,1995

3. An optimum sampling interval for digitising surface asperity profiles;Tsukada;Wear,1982

4. Optimum sampling interval for Ra surface measurement;Yim;Proc. Inst. Mech. Eng.,1991

5. K. Yanagi, N. Kobayashi, K. Kasahara, The allowable spacing for lattice data sampling by a round stylus tip and an assessment of the envelope surface. In: Transactions of the 6th International Conference on Metrology and Properties of Engineering Surfaces, Birmingham, England, 1994.

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