Dynamic investigation of electron trapping and charge decay in electron-irradiated Al2O3 in a scanning electron microscope: Methodology and mechanisms-Reference-Cited by-同舟云学术

Dynamic investigation of electron trapping and charge decay in electron-irradiated Al2O3 in a scanning electron microscope: Methodology and mechanisms

Published:2002-11 Issue:1-2 Volume:197 Page:114-127
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Fakhfakh S,Jbara O,Belhaj M,Fakhfakh Z,Kallel A,Rau E.I

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference54 articles.

1. An anomalous contrast effect in the scanning electron microscope

2. Control of charging in low-voltage SEM

3. An anomalous contrast in scanning electron microscopy of insulators: The pseudo-mirror effect

4. A study of deposited charge from electron beam lithography

5. Charge-reducing Effect of Chemically Amplified Resist in Electron-Beam Lithography

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