Explanation of the surface peak in charge integrated LEIS spectra-Reference-Cited by-同舟云学术

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Explanation of the surface peak in charge integrated LEIS spectra

Published:2003-04 Issue: Volume:203 Page:218-224
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Draxler M,Beikler R,Taglauer E,Schmid K,Gruber R,Ermolov S.N,Bauer P

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference17 articles.

1. Surface Analysis – The Principal Techniques;Taglauer,1997

2. Surface and Thin Film Analysis;Bauer,2002

3. Surface and Thin Film Analysis;Palmetshofer,2002

4. Handbook of Modern Ion Beam Materials Analysis;Leavitt,1995

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. An in situ ToF-LEIS characterization of the surface of Ti-based thin films under oxygen exposure and at elevated temperatures;Applied Surface Science;2023-11

2. Liquid Surfaces;Surface and Interface Science;2020-01-10

3. Temperature-dependent in-situ LEIS measurement of W surface enrichment by 250 eV D sputtering of EUROFER;Nuclear Materials and Energy;2018-08

4. A procedure to determine electronic energy loss from relative measurements with TOF-LEIS;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2013-12

5. Computer simulations of surface analysis using ion beams;Progress in Surface Science;2006-01

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