Author:
Schöne H,Walsh D.S,Sexton F.W,Doyle B.L,Dodd P.E,Aurand J.F,Wing N
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
23 articles.
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1. Nuclear microprobe investigation of the effects of ionization and displacement damage in vertical, high voltage GaN diodes;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-08
2. Semiconductor Characterization by Scanning Ion Beam Induced Charge (IBIC) Microscopy;ISRN Materials Science;2013-01-17
3. Single ion hit detection set-up for the Zagreb ion microprobe;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2012-04
4. Impurity mapping in sulphide minerals using Time-resolved Ion Beam Induced Current imaging;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2010-06
5. A review of ion beam induced charge microscopy;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-11